|
 Semicon
Taiwan 2005 |
| 日期： |
12-14 September 2005 |
| 地點： |
TWTC Taipei, Taiwan |
| 攤位號： |
Hall 1, #A714 |
| 參展産品： |
|
| QUALITAU： |
DSTP 9012: Desktop semiconductor parametric testerMulti-Site probe stationACE(AC Electromigration) |
| CyberOpotics: |
Wafer SenceTM ALSWafer Mapping Sensors |
| Chuonpa超音波工業: |
High Speed Rotary-Head Ultrasonic Wire Bonder for Large Wire |
| MicroE: |
Vacuum EncodersAtmospheric EncodersDigital Output EncodersAnalog Output Encoders |
| Sigmatech: |
Wafer Thickness analysis system晶圓厚度及缺陷檢測設備 |
| Precision: |
contact pin |
| Ambios: |
Surface profilometers |
| CI SEMI: |
NTM Delta:Advanced In-situ Emissivity Independent Non-contact Temperature
Monitor |
| WetSpec100:In-line CMP/Cleaning Process Analyzer |
| ASTP: |
VCA4612s:Auto Mapping Wafer Surface Analyzer |
| AST: |
Sputter system, Wafer Bonding System, Evaporator system, PECVD System, Plasma Stripper System, Evaporator System |
| Advance Semiconductor Test:
Analog/Mix-signal IC tester |
| MM: |
Wafer Level Reliability, Speciality Probes |
|
|
| Semicon
Taiwan 2003 |
| 日期： |
15-17 September 2003 |
| 地點： |
TWTC Taipei, Taiwan |
| 攤位號： |
Hall 1, #581,582 |
| 參展産品： |
|
| QUALITAU： |
ACE, MIRA System, Infinity System, Probing System |
| ECO： |
CMP Endpoint detector |
| JUSTEK： |
Linear Motor |
| PSIA： |
Atomic Force Microscope |
| AMBIOS： |
XP-2 / Surface Profilemeter |
| ELIONIX： |
E-Beam Lithography System |
| MARKEM： |
Marking system |
| PRESISION： |
Pin, Contact Ass'y for IC |
| DENKEN： |
Handler(pick and place) |
| Cyberoptics： |
Wafer levering |
|
|
| Semicon China 2003 |
| 日期： |
12-14 March 2003 |
| 地點： |
SNIEC Shanghai, China |
| 攤位號： |
Hall 2, #2201 |
| 參展産品： |
|
| ECO： |
Physics CMP-end point detector for STI BPSG |
| Unitek： |
SC-2501 / Spin Jet Cleaner |
| Sometech： |
Video Inspection 影像檢測系統 |
| Mission Peak： |
Optics MP-100-ME / MP 100-S Portable Thin-Film |
|
Thickness Measurement System |
| Kofloc： |
Mass Flow Controller |
| Yamashin： |
Filters for Advanced Technology |
| DongJin： |
Photo Resist 光刻膠 |
| Markem： |
3010CR/CO2 Laser |
| CI： |
即時溫度量測設備 |
|
|
| Semicon Taiwan 2002
|
| 日期： |
16-18 September 2002 |
| 地點： |
Taipei World Trade Center |
| 攤位號： |
477,478 |
| 參展産品： |
|
| aLink M: |
Puffin Coaxial Tube Pump |
| Ambios: |
XP-2 / Surface Profilemeter |
| ICE: |
TR20000V / High Speed Dual Track Tape |
| JUSTEK: |
JTM20-0420 / High Speed High Precision Linear Motion System |
| KOFLOC: |
Mass Flow Controller |
| MARKEM: |
3010 Code Renner / Smartlase Laser Marking System Ink & Marking System |
| Precision: |
Pin, Contact Ass'y for IC |
| PSIA: |
XE-100 / High Accuracy Small Sample SPM |
| Qualitau: |
ACE, MIRA System, Infinity System, Probing System |
| Qubic: |
QWB320 / 2nd & 3rd Optical Vision Inspection Module |
| Sometech: |
IT System / Video Microscope, Image Management & Measurement & Analysis S/W |
| SZ: |
RF, Analog Mixed Signal, Power IC Tester |
| Tepla: |
SIRD / Wafer Stress easurement , TWIN / Thermal Wave Inspection |
| VACOM: |
Vacuum Gauge |
|
|
| Semicon Taiwan 2001
|
| 日期： |
17-19 September 2001 |
| 地點： |
Taipei World Trade Center |
| 攤位號： |
581,582 |
| 參展産品： |
|
| EURO TECH: |
ULTRASONIC / Wafer Cleaning System |
| IC EQUIPMENT: |
TTR 6000 / Tray to Tray Reel System |
| MARKEM: |
U1481, 3004 / Direct Laser Tray Marking System, Green Laser |
| QUALITAU: |
Quad Density System, ACE, HCT, TDDB |
| SZ TESTSYSTEM: |
M3650 / High Speed Mixed Singal Test System |
| TNP: |
DUV250i / DUV Microscope |
| AST: |
VCA-Optima / Contact Angle, Plasma |
| PRECISION: |
Pin, Contact Ass'y for IC |
|
KOFLOC: |
Gas Mass Flow Metersw Controller, Needle Valve, Gas Generator, Liquid Flow Metter, CMP Slurry Supply System, Chemical Mixing & Diluting System |
| VACOM: |
Vacuum Gauge |
| R & A Metal: |
Low-Alpha Lead Solder |
| TEPLA: |
SIRD, TWIN |
|
|
